13 search results - page 2 / 3 » Fault Diagnosis in Integrated Circuits with BIST |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
This paper presents a design methodology that was applied to the design of a 2.4GHz dual-core SPARC64TM microprocessor with 90nm CMOS technology. It focuses on the newly adopted t...
JCP
2006
13 years 5 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
AAAI
1996
13 years 6 months ago
1996
Most model-based diagnosis systems, such as GDE and Sherlock, have concerned discrete, static systems such as logic circuits and use simple constraint propagation to detect incons...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...