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» Fault Tolerant External Memory Algorithms
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DATE
2010
IEEE
161views Hardware» more  DATE 2010»
13 years 10 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich
RAS
2008
135views more  RAS 2008»
13 years 5 months ago
Constructing dependable certainty grids from unreliable sensor data
-- Measurements from sensors as they are used for robotic grid map applications typically show behavior like degradation or discalibration over time, which affects the quality of t...
Wilfried Elmenreich
EUROGP
2009
Springer
105views Optimization» more  EUROGP 2009»
13 years 10 months ago
Quantum Circuit Synthesis with Adaptive Parameters Control
The contribution presented herein proposes an adaptive genetic algorithm applied to quantum logic circuit synthesis that, dynamically adjusts its control parameters. The adaptation...
Cristian Ruican, Mihai Udrescu, Lucian Prodan, Mir...
LCTRTS
2009
Springer
14 years 8 days ago
A compiler optimization to reduce soft errors in register files
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
Jongeun Lee, Aviral Shrivastava
CORR
2010
Springer
206views Education» more  CORR 2010»
13 years 5 months ago
Detecting Anomalous Process Behaviour using Second Generation Artificial Immune Systems
Abstract. Artificial immune systems (AISs) are problem-solving systems inspired by the biological immune system. They have been successfully applied to a number of problem domains ...
Jamie Twycross, Uwe Aickelin, Amanda M. Whitbrook