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» Fault dictionary compaction by output sequence removal
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ICCAD
1994
IEEE
59views Hardware» more  ICCAD 1994»
13 years 8 months ago
Fault dictionary compaction by output sequence removal
Fault dictionary compaction has been accomplished in the past by removing responses on individual output pins for speci c test vectors. In contrast to the previous work, we presen...
Vamsi Boppana, W. Kent Fuchs
EURODAC
1995
IEEE
164views VHDL» more  EURODAC 1995»
13 years 8 months ago
Bottleneck removal algorithm for dynamic compaction and test cycles reduction
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
Srimat T. Chakradhar, Anand Raghunathan
VTS
1997
IEEE
96views Hardware» more  VTS 1997»
13 years 8 months ago
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
CIS
2005
Springer
13 years 10 months ago
Distance Protection of Compensated Transmission Line Using Computational Intelligence
A new approach for protection of transmission line including TCSC is presented in this paper. The proposed method includes application of Fuzzy Neural Network for distance relaying...
S. R. Samantaray, Pradipta K. Dash, Ganapati Panda...