33 search results - page 6 / 7 » Fault isolation for device drivers |
CSREAESA
2008
13 years 6 months ago
2008
A group testing-based BIST technique to identify faulty hard cores in FPGA devices is presented. The method provides for isolation of faults in embedded cores as demonstrated by ex...
EUROPAR
2009
Springer
13 years 10 months ago
2009
Springer
Data access in HPC infrastructures is realized via user-level networking and OS-bypass techniques through which nodes can communicate with high bandwidth and low-latency. Virtualiz...
ISCA
2005
IEEE
13 years 10 months ago
2005
IEEE
Scaling feature size improves processor performance but increases each device’s susceptibility to defects (i.e., hard errors). As a result, fabrication technology must improve s...
MICRO
2009
IEEE
13 years 12 months ago
2009
IEEE
Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity...
DSN
2007
IEEE
13 years 11 months ago
2007
IEEE
The choice of error model used for robustness evaluation of Operating Systems (OSs) influences the evaluation run time, implementation complexity, as well as the evaluation preci...