12 search results - page 3 / 3 » Fault simulation of interconnect opens in digital CMOS circu... |
MICRO
2008
IEEE
14 years 10 days ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
PATMOS
2007
Springer
14 years 2 days ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...