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MICRO   2008 IEEE/ACM International Symposium on Microarchitecture
Wall of Fame | Most Viewed MICRO-2008 Paper
MICRO
2008
IEEE
208views Hardware» more  MICRO 2008»
8 years 7 months ago
Microarchitecture soft error vulnerability characterization and mitigation under 3D integration technology
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
Wangyuan Zhang, Tao Li
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