75 search results - page 15 / 15 » Fault tolerant methods for reliability in FPGAs |
SIGOPSE
1990
ACM
13 years 9 months ago
1990
ACM
In the Sprite environment, tolerating faults means recovering from them quickly. Our position is that performance and availability are the desired features of the typical locally-...
GLVLSI
2009
IEEE
13 years 2 months ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...
GI
2004
Springer
13 years 10 months ago
2004
Springer
: The transition from microelectronics to nanoelectronics reaches physical limits and results in a paradigm shift in the design and fabrication of electronic circuits. The conserva...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
LCTRTS
2010
Springer
13 years 9 months ago
2010
Springer
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...