This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
Abstract. There have been some Artificial Intelligence applications developed for electronic circuits diagnosis, but much remains to be done in this field, above all in the analo...
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
Walter M. Lindermeir, Helmut E. Graeb, Kurt Antrei...