194 search results - page 2 / 39 » Functional Test Generation Based on Combined Random and Dete... |
CEC
2005
IEEE
13 years 10 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
CORR
2010
Springer
13 years 2 months ago
2010
Springer
In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
IFIP
2001
Springer
13 years 9 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
ICTAC
2004
Springer
13 years 10 months ago
2004
Springer
Abstract. The classical work on test case generation and formal methods focuses either on algebraic or model-based specifications. In this paper we propose an approach to derive t...