ITC 1996 - PDF Preprint Papers

ITC 1996 International Test Conference

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ITC
1996
IEEE

432views Hardware» more ITC 1996»

Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms

13 years 8 months ago

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Anthony Taylor, Gregory A. Maston

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Id	Views	Title	Status

1	432	Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms	claim
2	127	Altering a Pseudo-Random Bit Sequence for Scan-Based BIST	claim
3	123	IDDQ Test: Sensitivity Analysis of Scaling	claim
4	114	A Demonstration IC for the P1149.4 Mixed-Signal Test Standard	claim
5	107	Orthogonal Scan: Low-Overhead Scan for Data Paths	claim
6	107	Digital Integrated Circuit Testing using Transient Signal Analysis	claim
7	99	Detecting Delay Flaws by Very-Low-Voltage Testing	claim
8	98	Mixed-Mode BIST Using Embedded Processors	claim
9	96	Analysis and Detection of Timing Failures in an Experimental Test Chip	claim
10	96	A Roadmap for Boundary-Scan Test Reuse	claim
11	94	An ATPG-Based Framework for Verifying Sequential Equivalence	claim
12	83	Test Generation for Global Delay Faults	claim
13	78	Identification and Test Generation for Primitive Faults	claim
14	78	Realistic-Faults Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits	claim

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