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EMSOFT
2005
Springer
13 years 10 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
ISCA
2009
IEEE
159views Hardware» more  ISCA 2009»
13 years 12 months ago
End-to-end register data-flow continuous self-test
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
Javier Carretero, Pedro Chaparro, Xavier Vera, Jau...