14 search results - page 3 / 3 » GRACE: Generative Robust Analog Circuit Exploration |
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
FOCS
1999
IEEE
13 years 9 months ago
1999
IEEE
Various efforts ([?, ?, ?]) have been made in recent years to derandomize probabilistic algorithms using the complexity theoretic assumption that there exists a problem in E = dti...
GLVLSI
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...
ESCIENCE
2007
IEEE
13 years 11 months ago
2007
IEEE
The electronics design industry is facing major challenges as transistors continue to decrease in size. The next generation of devices will be so small that the position of indivi...