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» Generation of Integration Tests for Self-Testing Components
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AMOST
2007
ACM
13 years 8 months ago
Combining test case generation for component and integration testing
When integrating dierent system components, the interaction between dierent features is often error prone. Typically errors occur on interruption, concurrency or disabling/ enabli...
Sebastian Benz
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
13 years 10 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
VLSID
2004
IEEE
135views VLSI» more  VLSID 2004»
14 years 5 months ago
Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
M. S. Gaur, Mark Zwolinski
ETS
2007
IEEE
128views Hardware» more  ETS 2007»
13 years 6 months ago
Selecting Power-Optimal SBST Routines for On-Line Processor Testing
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...
Andreas Merentitis, Nektarios Kranitis, Antonis M....
TAICPART
2006
IEEE
134views Education» more  TAICPART 2006»
13 years 10 months ago
Integration Testing of Components Guided by Incremental State Machine Learning
The design of complex systems, e.g., telecom services, is nowadays usually based on the integration of components (COTS), loosely coupled in distributed architectures. When compon...
Keqin Li 0002, Roland Groz, Muzammil Shahbaz