3 search results - page 1 / 1 » Handling partial correlations in yield prediction |
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
In modern circuit design, it is difficult to provide reliable parametric yield prediction since the real distribution of process data is hard to measure. Most existing approaches ...
ASPLOS
1996
ACM
13 years 9 months ago
1996
ACM
Branch prediction is an important mechanism in modern microprocessor design. The focus of research in this area has been on designing new branch prediction schemes. In contrast, v...