21 search results - page 2 / 5 » Hardware Dependability in the Presence of Soft Errors |
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
SIGMETRICS
2011
ACM
12 years 7 months ago
2011
ACM
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...
IOLTS
2006
IEEE
13 years 11 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These “soft errors” can be a nuisance or catastro...