28 search results - page 2 / 6 » Hardware Results Demonstrating Defect Detection Using Power ... |
ATS
2005
IEEE
13 years 11 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
This paper proposes Noise-Direct, a design methodology for power integrity aware floorplanning, using microarchitectural feedback to guide module placement. Stringent power constr...
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
DATE
2007
IEEE
13 years 12 months ago
2007
IEEE
This paper describes a novel test method for continuous-time adaptive equalizers. This technique applies a two-sinusoidal-tone signal as stimulus and includes an RMS detector for ...
DATE
2000
IEEE
13 years 10 months ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...