This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
— Process variations in digital circuits make sequential circuit timing validation an extremely challenging task. In this paper, a Statistical Bellman-Ford (SBF) algorithm is pro...
Network service providers and customers are often concerned with aggregate performance measures that span multiple network paths. Unfortunately, forming such network-wide measures ...
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...