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ASPDAC
2006
ACM
155views Hardware» more  ASPDAC 2006»
13 years 11 months ago
Delay defect screening for a 2.16GHz SPARC64 microprocessor
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...
Noriyuki Ito, Akira Kanuma, Daisuke Maruyama, Hito...
ASPDAC
2006
ACM
230views Hardware» more  ASPDAC 2006»
13 years 11 months ago
Statistical Bellman-Ford algorithm with an application to retiming
— Process variations in digital circuits make sequential circuit timing validation an extremely challenging task. In this paper, a Statistical Bellman-Ford (SBF) algorithm is pro...
Mongkol Ekpanyapong, Thaisiri Watewai, Sung Kyu Li...
SIGMETRICS
2005
ACM
102views Hardware» more  SIGMETRICS 2005»
13 years 10 months ago
A statistical framework for efficient monitoring of end-to-end network properties
Network service providers and customers are often concerned with aggregate performance measures that span multiple network paths. Unfortunately, forming such network-wide measures ...
David B. Chua, Eric D. Kolaczyk, Mark Crovella
ASPDAC
2004
ACM
102views Hardware» more  ASPDAC 2004»
13 years 10 months ago
TranGen: a SAT-based ATPG for path-oriented transition faults
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
Kai Yang, Kwang-Ting Cheng, Li-C. Wang
VTS
1997
IEEE
73views Hardware» more  VTS 1997»
13 years 9 months ago
Obtaining High Fault Coverage with Circular BIST Via State Skipping
Despite all of the advantages that circular BIST ofsers compared to conventional BIST approaches in terms of low area overhead, simple control logic, and easy insertion, it has se...
Nur A. Touba