23 search results - page 5 / 5 » Hardware Trojan Detection Using Path Delay Fingerprint |
TVLSI
2002
13 years 4 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
— With increasing reliability concerns for current and next generation VLSI technologies, fault-tolerance is fast becoming an integral part of system-on-chip (SoC) and multicore ...
CODES
2009
IEEE
13 years 11 months ago
2009
IEEE
Since flash memory has many attractive characteristics such as high performance, non-volatility, low power consumption and shock resistance, it has been widely used as storage med...