3 search results - page 1 / 1 » High volume microprocessor test escapes, an analysis of defe... |
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
IFIP
2010
Springer
12 years 11 months ago
2010
Springer
Concurrent software is difficult to verify. Because the thread schedule is not controlled by the application, testing may miss defects that occur under specific thread schedules. T...