20 search results - page 2 / 4 » Identification and Test Generation for Primitive Faults |
DSD
2007
IEEE
14 years 3 days ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
VLSID
2002
IEEE
14 years 6 months ago
2002
IEEE
We propose the redundancy identification of wire replacement faults. The solutions rely on the satisfiability (SAT) formulation of redundancy identification, augmented with the me...
ICCAD
1998
IEEE
13 years 10 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
ICECCS
2002
IEEE
13 years 10 months ago
2002
IEEE
This paper describes the application of the Test Automation Framework on the Mars Polar Lander (MPL) software. The premature shutdown of the descent engine on the MPL spacecraft i...
ICCD
2006
IEEE
14 years 2 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...