20 search results - page 3 / 4 » Impact of Modern Process Technologies on the Electrical Para... |
IEICET
2008
13 years 5 months ago
2008
This paper studies impact of the well edge proximity effect on digital circuit delay, based on model parameters extracted from test structures in an industrial 65nm wafer process. ...
FCCM
2007
IEEE
14 years 3 days ago
2007
IEEE
— Modern advances in reconfigurable analog technologies are allowing field-programmable analog arrays (FPAAs) to dramatically grow in size, flexibility, and usefulness. This p...
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid’s...
DATE
2003
IEEE
13 years 11 months ago
2003
IEEE
We propose a new metric for evaluation of interconnect architectures. This metric is computed by optimal assignment of wires from a given wire length distribution (WLD) to a given...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...