32 search results - page 1 / 7 » Impact of Multiple-Detect Test Patterns on Product Quality |
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...
ISR
2006
13 years 4 months ago
2006
Prior research suggests that supply chain collaboration has enabled companies to compete more efficiently in a global economy. We investigate a class of collaboration software for...
SIGSOFT
2010
ACM
12 years 11 months ago
2010
ACM
In this paper, we study the decision making process involved in the five year lifecycle of a Bluetooth software product produced by a large, multi-national test and measurement fi...
IWPC
2010
IEEE
13 years 3 months ago
2010
IEEE
Abstract—Correcting software defects accounts for a significant amount of resources such as time, money and personnel. To be able to focus testing efforts where needed the most,...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...