3 search results - page 1 / 1 » Implementing a Scheme for External Deterministic Self-Test |
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
SIAMCOMP
2002
13 years 4 months ago
2002
abstract Alain Mayer Yoram Ofeky Rafail Ostrovskyz Moti Yungx We investigate the problem of self-stabilizing round-robin token management scheme on an anonymous bidirectional ring...