3 search results - page 1 / 1 » Improved Algorithms for Constructive Multi-Phase Test Point ... |
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
VTS
2007
IEEE
13 years 10 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
WACV
2005
IEEE
13 years 10 months ago
2005
IEEE
The performance of face recognition systems that use two-dimensional images depends on consistent conditions w.r.t. lighting, pose, and facial appearance. We are developing a face...