VTS   2007 IEEE VLSI Test Symposium
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10 years 3 days ago
Multiple Bit Upset Tolerant Memory Using a Selective Cycle Avoidance Based SEC-DED-DAEC Code
Conventional error correcting code (ECC) schemes used in memories and caches cannot correct double bit errors caused by a single event upset (SEU). As memory density increases, mu...
Avijit Dutta, Nur A. Touba
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