12 search results - page 2 / 3 » Improving cache lifetime reliability at ultra-low voltages |
RTAS
2005
IEEE
13 years 10 months ago
2005
IEEE
Dynamic voltage and frequency scaling is increasingly being used to reduce the energy requirements of embedded and real-time applications by exploiting idle CPU resources, while s...
ISCA
2008
IEEE
13 years 11 months ago
2008
IEEE
Flash is a widely used storage device that provides high density and low power, appealing properties for general purpose computing. Today, its usual application is in portable spe...
MICRO
2007
IEEE
13 years 10 months ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
ASPLOS
2010
ACM
13 years 11 months ago
2010
ACM
DRAM is facing severe scalability challenges in sub-45nm technology nodes due to precise charge placement and sensing hurdles in deep-submicron geometries. Resistive memories, suc...
ICPP
2008
IEEE
13 years 11 months ago
2008
IEEE
A rising horizon in chip fabrication is the 3D integration technology. It stacks two or more dies vertically with a dense, high-speed interface to increase the device density and ...