11 search results - page 1 / 3 » Improving the Proportion of At-Speed Tests in Scan BIST |
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
ITC
1992
IEEE
13 years 8 months ago
1992
IEEE
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...
DAC
1999
ACM
14 years 5 months ago
1999
ACM
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
VLSID
2002
IEEE
14 years 5 months ago
2002
IEEE
