39 search results - page 3 / 8 » Improving yield and reliability of chip multiprocessors |
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
MICRO
2007
IEEE
13 years 11 months ago
2007
IEEE
The trends in enterprise IT toward service-oriented computing, server consolidation, and virtual computing point to a future in which workloads are becoming increasingly diverse i...
HPCA
2011
IEEE
12 years 9 months ago
2011
IEEE
Queues are commonly used in multithreaded programs for synchronization and communication. However, because software queues tend to be too expensive to support finegrained paralle...
ICCD
2003
IEEE
14 years 2 months ago
2003
IEEE
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
EUROSYS
2007
ACM
14 years 2 months ago
2007
ACM
The major chip manufacturers have all introduced chip multiprocessing (CMP) and simultaneous multithreading (SMT) technology into their processing units. As a result, even low-end...