We evaluate the reliability of storage system schemes consisting of an equal numbers of data disks and parity disks where each parity disk contains the exclusive or (XOR) of two o...
The negative effect of electromigration on signal and power line lifetime and functional reliability is an increasingly important problem for the physical design of integrated cir...
Research into embedded sensor networks has placed increased focus on the problem of developing reliable and flexible software for microcontroller-class devices. Languages such as ...
Increasing power consumption of high-performance systems leads to reliability, survivability, and cooling related problems. Motivated by this observation, several recent efforts f...
In the nanometer IC design, dummy fill is often performed to improve layout pattern uniformity and the post-CMP quality. However, filling dummies might greatly increase intercon...