3 search results - page 1 / 1 » Increasing Robustness of SAT-based Delay Test Generation Usi... |
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 2 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
DAC
1994
ACM
13 years 9 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
SIGSOFT
2010
ACM
13 years 2 months ago
2010
ACM
This article proposes a research agenda aimed at enabling optimized testing and analysis processes and tools to support component-based software development communities. We hypoth...