40 search results - page 1 / 8 » Initialization of Sequential Circuits and its Application to... |
ET
1998
13 years 4 months ago
1998
ATS
1997
IEEE
13 years 9 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
TCAD
1998
13 years 4 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the development of high speed circuits beyond the 2-GHz mark, the significance of automatic test pattern generation for Path Delay Faults (PDFs) drastically increased in t...