60 search results - page 11 / 12 » Is Time Ripe for Fabric on a Chip |
INFOCOM
2003
IEEE
13 years 10 months ago
2003
IEEE
— In this paper, we propose two schemes for the load balanced Birkhoff-von Neumann switches to provide guaranteed rate services. As in [7], the first scheme is based on an Earli...
DSN
2004
IEEE
13 years 9 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a fast-lock mixed-mode delaylocked loop (MMDLL) for wide-range operation and multiphase outputs. The architecture of the proposed DLL uses the mixed-mode time...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2002
ACM
14 years 6 months ago
2002
ACM
In this paper we propose a novel integrated circuit and architectural level technique to reduce leakage power consumption in high performance cache memories using single Vt (trans...