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» JVM Susceptibility to Memory Errors
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EMSOFT
2005
Springer
13 years 11 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
DAC
2011
ACM
12 years 5 months ago
Understanding the impact of power loss on flash memory
Flash memory is quickly becoming a common component in computer systems ranging from music players to mission-critical server systems. As flash plays a more important role, data ...
Hung-Wei Tseng, Laura M. Grupp, Steven Swanson
OOPSLA
2009
Springer
13 years 12 months ago
Grace: safe multithreaded programming for C/C++
The shift from single to multiple core architectures means that programmers must write concurrent, multithreaded programs in order to increase application performance. Unfortunate...
Emery D. Berger, Ting Yang, Tongping Liu, Gene Nov...
SC
2009
ACM
14 years 4 days ago
Future scaling of processor-memory interfaces
Continuous evolution in process technology brings energyefficiency and reliability challenges, which are harder for memory system designs since chip multiprocessors demand high ba...
Jung Ho Ahn, Norman P. Jouppi, Christos Kozyrakis,...
DATE
2006
IEEE
84views Hardware» more  DATE 2006»
13 years 11 months ago
Vulnerability analysis of L2 cache elements to single event upsets
Memory elements are the most vulnerable system component to soft errors. Since memory elements in cache arrays consume a large fraction of the die in modern microprocessors, the p...
Hossein Asadi, Vilas Sridharan, Mehdi Baradaran Ta...