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ISBI
2006
IEEE
14 years 6 months ago
Joint texture and topography estimation for extended depth of field in brightfield microscopy
Brightfield microscopy often suffers from limited depth of field, which prevents thick specimens from being imaged entirely in-focus. By optically sectioning the specimen, the inf...
François Aguet, Dimitri Van De Ville, Micha...
TIP
2008
139views more  TIP 2008»
13 years 5 months ago
Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, t...
François Aguet, Dimitri Van De Ville, Micha...