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» Layout Decomposition Approaches for Double Patterning Lithog...
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TVLSI
2010
12 years 12 months ago
Pattern Sensitive Placement Perturbation for Manufacturability
The gap between VLSI technology and fabrication technology leads to strong refractive effects in lithography. Consequently, it is a huge challenge to reliably print layout features...
Shiyan Hu, Patrik Shah, Jiang Hu
ISPD
2007
ACM
151views Hardware» more  ISPD 2007»
13 years 6 months ago
Pattern sensitive placement for manufacturability
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Shiyan Hu, Jiang Hu
ICIP
2008
IEEE
14 years 6 months ago
Inverse image problem of designing phase shifting masks in optical lithography
The continual shrinkage of minimum feature size in integrated circuit (IC) fabrication incurs more and more serious distortion in the optical lithography process, generating circu...
Stanley H. Chan, Edmund Y. Lam
ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
13 years 2 months ago
GREMA: Graph reduction based efficient mask assignment for double patterning technology
Double patterning technology (DPT) has emerged as the most hopeful candidate for the next technology node of the ITRS roadmap [1]. The goal of a DPT decomposer is to decompose the...
Yue Xu, Chris Chu