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TVLSI   2010
Wall of Fame | Most Viewed TVLSI-2010 Paper
TVLSI
2010
12 years 11 months ago
Improving Multi-Level NAND Flash Memory Storage Reliability Using Concatenated BCH-TCM Coding
By storing more than one bit in each memory cell, multi-level per cell (MLC) NAND flash memories are dominating global flash memory market due to their appealing storage density ad...
Shu Li, Tong Zhang
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