7 search results - page 2 / 2 » Learning Acyclic Probabilistic Circuits Using Test Paths |
DAC
1994
ACM
13 years 9 months ago
1994
ACM
A powerful combinational path sensitization engine is required for the efficient implementation of tools for test pattern generation, timing analysis, and delay fault testing. Path...
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...