10 search results - page 2 / 2 » Limits on voltage scaling for caches utilizing fault toleran... |
DSD
2008
IEEE
13 years 7 months ago
2008
IEEE
Due to modern technology trends such as decreasing feature sizes and lower voltage levels, fault tolerance is becoming increasingly important in computing systems. Shared memory i...
MICRO
2009
IEEE
13 years 12 months ago
2009
IEEE
Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Large SRAM structures used for caches are particularly ...
TDSC
2010
13 years 3 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
DSN
2002
IEEE
13 years 10 months ago
2002
IEEE
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...