980 search results - page 1 / 196 » Logical Testing |
JSA
2000
13 years 5 months ago
2000
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
3DIC
2009
IEEE
14 years 6 days ago
2009
IEEE
—A high-sensitivity capacitive-coupling interface is presented for wireless wafer testing systems. The transmitter is a buffer that drives the transmitter pad, and the receiver c...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper we introduce a tool which is capable of verifying an 1149.1 test logic implementation and its compliance to the IEEE 1149.1 Standard [1][2] while providing a precise...
TABLEAUX
2000
Springer
13 years 9 months ago
2000
Springer
Abstract. This paper presents the results of applying RACE, a description logic system for ALCNHR+ , to modal logic SAT problems. Some aspects of the RACE architecture are discusse...
ICST
2009
IEEE
14 years 1 days ago
2009
IEEE
In this paper, we consider typical applications in which the business logic is separated from the access control logic, implemented in an independent component, called the Policy ...