11 search results - page 2 / 3 » MARS-S: Modeling and Reduction of Soft Errors in Sequential ... |
PATMOS
2007
Springer
13 years 11 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
ISCAS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
TCAD
2008
13 years 4 months ago
2008
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
MICRO
2006
IEEE
13 years 4 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...