2 search results - page 1 / 1 » Manifestation of Precharge Faults in High Speed DRAM Devices |
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
HPCA
2009
IEEE
14 years 5 months ago
2009
IEEE
Decreasing hardware reliability is expected to impede the exploitation of increasing integration projected by Moore's Law. There is much ongoing research on efficient fault t...