3 search results - page 1 / 1 » March SL: A Test For All Static Linked Memory Faults |
ATS
2003
IEEE
13 years 10 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
MTDT
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...