5 search results - page 1 / 1 » Matching of low-noise amplifiers at high frequencies |
ANNS
2007
13 years 6 months ago
2007
The task of determining low noise amplifier (LNA) high-frequency performance in functional testing is as challenging as designing the circuit itself due to the difficulties associa...
ISCAS
2003
IEEE
13 years 10 months ago
2003
IEEE
Higher transistor transition frequencies, lower supply voltages and smaller physical dimensions are, nowadays, general trends in the semiconductor industry. Operating at lower sup...
DDECS
2006
IEEE
13 years 10 months ago
2006
IEEE
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
: This project involves the design of a CMOS RF RMS Detector that converts the RMS voltage amplitude of an RF signal to a DC voltage. Its high input impedance and small area make i...