3 search results - page 1 / 1 » Mathematical yield estimation for two-dimensional-redundancy... |
ICCAD
2010
IEEE
13 years 3 months ago
2010
IEEE
Defect repair has become a necessary process to enhance the overall yield for memories since manufacturing a natural good memory is difficult in current memory technologies. This ...
TCAD
2008
13 years 5 months ago
2008
Abstract--The fabrication of crossbar memories with sublithographic features is expected to be feasible within several emerging technologies; in all of them, the nanowire (NW) deco...
MMMACNS
2001
Springer
13 years 10 months ago
2001
Springer
Abstract. Many design flaws and incorrect analyses of cryptographic protoAppeared in the Proceedings of the First International Workshop on Mathematical Methods, Models and Archit...