2 search results - page 1 / 1 » Metrology for analog module testing using analog testability... |
ICCAD
1996
IEEE
13 years 10 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
ROBIO
2006
IEEE
14 years 23 hour ago
2006
IEEE
— A fully embedded tactile/force sensor system to be installed on the phalanges of a robot hand is presented in this paper. The sensor consists of a distributed array of analog t...