8 search results - page 2 / 2 » Microarchitecture-Based Introspection: A Technique for Trans... |
ISCA
2007
IEEE
13 years 11 months ago
2007
IEEE
ACE analysis is a technique to provide an early reliability estimate for microprocessors. ACE analysis couples data from performance models with low level design details to identi...
TDSC
2010
13 years 3 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
ISCA
2007
IEEE
13 years 11 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...