6 search results - page 1 / 2 » Minimal March Tests for Dynamic Faults in Random Access Memo... |
ETS
2006
IEEE
13 years 5 months ago
2006
IEEE
MTDT
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for Random Access Memories (RAMs), and shows that none of the current industria...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...