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DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper we analyze the test power of SRAM memories and demonstrate that the full functional precharge activity is not necessary during test mode because of the predictable a...
ICCAD
2007
IEEE
14 years 1 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...