7 search results - page 1 / 2 » Minimizing the Cost of Fault Location when Testing from a Fi... |
COMCOM
1999
13 years 4 months ago
1999
If a test does not produce the expected output, the incorrect output may have been caused by an earlier state transfer failure. Ghedamsi and von Bochmann [1992] and Ghedamsi et al...
PTS
2003
13 years 6 months ago
2003
In this paper, we propose a method for the derivation of an adaptive diagnostic test suite when the system specification and implementation are given in the form of an extended fin...
ISSRE
2002
IEEE
13 years 9 months ago
2002
IEEE
A number of strategies have been proposed for state-based class testing. An important proposal was made by Chow [5] and adapted by Binder [3]: It consists in deriving test sequenc...
EURODAC
1994
IEEE
13 years 8 months ago
1994
IEEE
The paper presents a synthesis approach for pipelinelike controller structures. These structures allow to implement a built-in self-test in two sessions without any extra test reg...
ICFP
2006
ACM
14 years 4 months ago
2006
ACM
A transient hardware fault occurs when an energetic particle strikes a transistor, causing it to change state. These faults do not cause permanent damage, but may result in incorr...