7 search results - page 1 / 2 » Module Size Distribution and Defect Density |
ISSRE
2000
IEEE
13 years 9 months ago
2000
IEEE
Data from several projects show a significant relationship between the size of a module and its defect density. Here we address implications of this observation. Does the overall ...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
ICSE
2004
IEEE-ACM
14 years 5 months ago
2004
IEEE-ACM
The paper describes results of an empirical study, where some hypotheses about the impact of reuse on defect-density and stability, and about the impact of component size on defec...
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
Growth of pixel density and sensor array size increases the likelihood of developing in-field pixel defects. An ongoing study on defect development in imagers has now provided us ...
ICSE
2005
IEEE-ACM
14 years 5 months ago
2005
IEEE-ACM
Software systems evolve over time due to changes in requirements, optimization of code, fixes for security and reliability bugs etc. Code churn, which measures the changes made to...